Description
Coverage percentage
>95%
Monolayer percentage
>60%
Mobility @ 300 K
up to 3000 cm2V-1s-1
Conductivity
n-type
Optical transmittance
>97%
Sheet resistance @ 300 k
2KΩ - 5KΩ
Sheet carrier density
5x1011 - 5.0x1012
Quality control
Full characterization
- Optical microscope
- Atomic force microscope
- Raman
- Electrical characterization
Additional methods are also available:
- SEM
- XPS
- HRTEM
Applications
High-performance RF transistors
Ultrafast photodetectors
Gas sensors
Metrology